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dc.contributor.authorEngel, Michael
dc.contributor.authorSteiner, Mathias
dc.contributor.authorSeo, Jung-Woo T.
dc.contributor.authorHersam, Mark C.
dc.contributor.authorAvouris, Phaedon
dc.date.accessioned2018-05-10T13:36:45Z
dc.date.available2018-05-10T13:36:45Z
dc.date.issued2015-03
dc.identifierhttp://dx.doi.org/10.1021/acs.nanolett.5b00048
dc.identifier.issn1530-6984
dc.identifier.urihttp://hdl.handle.net/10438/23455
dc.descriptionConteúdo online de acesso restrito pelo editorpor
dc.description.abstractWe report on the dynamics of Spatial temperature distributions in aligned semiconducting carbon nanotube array devices with submicrometer, channel lengths. By using high resolution,optical microscopy in combination with electrical transport measurements, we observe under steady state bias conditions the emergence, of time-variable, 1061 temperature maxima with dimensions below 300 nm, and temperatures above 400 K. On the basis of time domain cross-correlation analysis, we investigate how the intensity fluctuations of the thermal radiation patterns are correlated with the overall device current. The analysis reveals, the interdependence, of electrical current fluctuations and time-variable hot spot formation that limits the overall device performance and, ultimately, may cause device degradation. The findings have implications for the future development of carbon nanotube-based technologies.eng
dc.description.sponsorshipNational Science Foundation [DMR-1006391, DMR-1121262]eng
dc.format.extentp. 2127-2131
dc.language.isoeng
dc.publisherAmer Chemical Soceng
dc.relation.ispartofseriesNano letterseng
dc.sourceWeb of Science
dc.subjectCarbon nanotubeseng
dc.subjectPower dissipationeng
dc.subjectThermal imagingeng
dc.subjectNanoelectronicseng
dc.subjectNanoopticseng
dc.subjectElectrical-transporteng
dc.titleHot spot dynamics in carbon nanotube array deviceseng
dc.typeArticle (Journal/Review)eng
dc.subject.areaTecnologiapor
dc.subject.bibliodataNanotubos de carbonopor
dc.subject.bibliodataNanoeletrônicapor
dc.contributor.affiliationFGV
dc.identifier.doi10.1021/acs.nanolett.5b00048
dc.rights.accessRightsrestrictedAccesseng
dc.identifier.WoS000351188000104
dc.identifier.researcheridHersam, Mark/B-6739-2009


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